Documentation Index
Automated Transactions (AT) is a technology created by CIYAM Developers which provides "Turing complete smart contracts" for any blockchain that implements it.
Automated Transactions Specification
Automated Transactions API Specification
Use Case: Atomic Cross-Chain Transfer
Use Case Tests: Crowdfunding Agent
Use Case: Dormant Funds Transfer
Use Case Tests: Dormant Funds Transfer
Test for AT instruction code 0x06 (ADD_DAT)
Test for AT instruction code 0x0b (AND_DAT)
Test for AT instruction code 0x23 (BEQ_DAT)
Test for AT instruction code 0x21 (BGE_DAT)
Test for AT instruction code 0x1f (BGT_DAT)
Test for AT instruction code 0x22 (BLE_DAT)
Test for AT instruction code 0x20 (BLT_DAT)
Test for AT instruction code 0x24 (BNE_DAT)
Test for AT instruction code 0x1e (BNZ_DAT)
Test for AT instruction code 0x0a (BOR_DAT)
Test for AT instruction code 0x1b (BZR_DAT)
Test for AT instruction code 0x03 (CLR_DAT)
Test for AT instruction code 0x05 (DEC_DAT)
Test for AT instruction code 0x09 (DIV_DAT)
Test for AT instruction code 0x32 (EXT_FUN)
Test for AT instruction code 0x33 (EXT_FUN_DAT)
Test for AT instruction code 0x34 (EXT_FUN_DAT_2)
Test for AT instruction code 0x35 (EXT_FUN_RET)
Test for AT instruction code 0x36 (EXT_FUN_RET_DAT)
Test for AT instruction code 0x37 (EXT_FUN_RET_DAT_2)
Test for AT instruction code 0x28 (FIN_IMD)
Test for AT instruction code 0x26 (FIZ_DAT)
Test for AT instruction code 0x04 (INC_DAT)
Test for AT instruction code 0x1a (JMP_ADR)
Test for AT instruction code 0x12 (JMP_SUB)
Test for AT instruction code 0x08 (MUL_DAT)
Test for AT instruction code 0x0d (NOT_DAT)
Test for AT instruction code 0x11 (POP_DAT)
Test for AT instruction code 0x10 (PSH_DAT)
Test for AT instruction code 0x13 (RET_SUB)
Test for AT instruction code 0x02 (SET_DAT)
Test for AT instruction code 0x0f (SET_IDX)
Test for AT instruction code 0x0e (SET_IND)
Test for AT instruction code 0x30 (SET_PCS)
Test for AT instruction code 0x01 (SET_VAL)
Test for AT instruction code 0x29 (STP_IMD)
Test for AT instruction code 0x27 (STZ_DAT)
Test for AT instruction code 0x07 (SUB_DAT)
Test for AT instruction code 0x25 (SUB_LEQ)